Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Low-voltage, large-scan angle MEMS analog micromirror arrays with hidden vertical comb-drive actuators
Dooyoung Hah   Huang, S.T.-Y.   Jui-Che Tsai   Toshiyoshi, H.   Wu, M.C.  
Dept. of Electr. Eng., Univ. of California, Los Angeles, CA, USA;

This paper appears in: Microelectromechanical Systems, Journal of
Publication Date: April 2004
Volume: 13,  Issue: 2
On page(s): 279- 289
ISSN: 1057-7157
INSPEC Accession Number: 7976543
Digital Object Identifier: 10.1109/JMEMS.2004.825314
Current Version Published: 2004-04-13

Abstract
This paper reports on novel polysilicon surface-micromachined one-dimensional (1-D) analog micromirror arrays fabricated using Sandia's ultraplanar multilevel MEMS technology-V (SUMMiT-V) process. Large continuous DC scan angle (23.6° optical) and low-operating voltage (6 V) have been achieved using vertical comb-drive actuators. The actuators and torsion springs are placed underneath the mirror (137×120 μm2) to achieve high fill-factor (91%). The measured resonant frequency of the mirror ranges from 3.4 to 8.1 kHz. The measured DC scanning characteristics and resonant frequencies agree well with theoretical values. The rise time is 120 μs and the fall time is 380 μs. The static scanning characteristics show good uniformity (<±3.2%) for a 1 × 10 array with a mirror pitch of 150 μm. The mechanical crosstalk between adjacent mirrors is less than 37 dB. These micromirror arrays have applications in 1×N wavelength-selective switches and N×N wavelength-selective crossconnects in wavelength-division multiplexing (WDM) networks.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (816 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved