Polarization-mode dispersion emulation with Maxwellian lengths and importance sampling
G. Biondini
W.L. Kath
Dept. of Eng. Sci. & Appl. Math., Northwestern Univ., Evanston, IL, USA;
This paper appears in: Photonics Technology Letters, IEEE
Publication Date: March 2004
Volume: 16,
Issue: 3
On page(s): 789-791
ISSN: 1041-1135
INSPEC Accession Number: 7919477
Digital Object Identifier: 10.1109/LPT.2004.823739
Current Version Published: 2004-03-03
Abstract
We describe an efficient polarization-mode dispersion (PMD) emulation method that combines a concatenation of birefringent sections having Maxwellian-distributed lengths with importance sampling. The method generates PMD statistics with accurate tail distributions using relatively few sections and reasonable numbers of samples, and allows the targeting of specific, arbitrarily large, first- and second-order PMD values.
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