Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Efficient computation of current in multiwire Z-pinch arrays
Strickler, T.S.   Gilgenbach, R.M.   Johnston, M.D.   Yue Ying Lau  
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA;

This paper appears in: Plasma Science, IEEE Transactions on
Publication Date: Dec. 2003
Volume: 31,  Issue: 6, Part 2
On page(s): 1384- 1387
ISSN: 0093-3813
INSPEC Accession Number: 7950517
Digital Object Identifier: 10.1109/TPS.2003.821357
Current Version Published: 2004-02-19

Abstract
This paper presents a fast, memory efficient, and accurate method to calculate the current distributions in solid wires in wire z-pinch arrays. Building upon previous work, we reformulate inductance equations to significantly reduce the number of variables from NwxNb to Nw+Nb-1, where Nw is the number of wires and Nb is the number of return conductor elements, or "backposts". Test cases of Nw and Nb in the hundreds show reduction of computing time by as much as five orders of magnitude. Extension of this inductive model to include resistive effects is indicated.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (325 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved