Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

An introduction to biometric recognition
Jain, A.K.   Ross, A.   Prabhakar, S.  
Dept. of Comput. Sci. & Eng., Michigan State Univ., USA;

This paper appears in: Circuits and Systems for Video Technology, IEEE Transactions on
Publication Date: Jan. 2004
Volume: 14,  Issue: 1
On page(s): 4- 20
ISSN: 1051-8215
INSPEC Accession Number: 7952000
Digital Object Identifier: 10.1109/TCSVT.2003.818349
Current Version Published: 2004-01-30

Abstract
A wide variety of systems requires reliable personal recognition schemes to either confirm or determine the identity of an individual requesting their services. The purpose of such schemes is to ensure that the rendered services are accessed only by a legitimate user and no one else. Examples of such applications include secure access to buildings, computer systems, laptops, cellular phones, and ATMs. In the absence of robust personal recognition schemes, these systems are vulnerable to the wiles of an impostor. Biometric recognition, or, simply, biometrics, refers to the automatic recognition of individuals based on their physiological and/or behavioral characteristics. By using biometrics, it is possible to confirm or establish an individual's identity based on "who she is", rather than by "what she possesses" (e.g., an ID card) or "what she remembers" (e.g., a password). We give a brief overview of the field of biometrics and summarize some of its advantages, disadvantages, strengths, limitations, and related privacy concerns.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1136 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved