Strategy and prototype tool for doing fault modeling in a nano-technology
Dysart, T.J.
Kogge, P.M.
Dept. of Comput. Sci. & Eng., Notre Dame Univ., USA;
This paper appears in: Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
Publication Date: 12-14 Aug. 2003
Volume: 1,
On page(s): 356- 359 vol.2
ISSN:
ISBN: 0-7803-7976-4
INSPEC Accession Number: 7824672
Digital Object Identifier: 10.1109/NANO.2003.1231791
Current Version Published: 2003-09-15
Abstract
Quantum-dot cellular automata (QCA) has been proposed as a replacement for CMOS circuits. The major difference between QCA and CMOS is that electronic charge, not current, is the information carrier. A complete set of logic gates has been created and some have been experimentally tested with metal-dots acting as quantum dots. Molecular implementations are currently being examined. This work examines the possible defects that may occur in the fabrication of both types of QCA systems. Fault models for these defects are developed, and a prototype tool with a strategy for fault modeling is outlined.
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