Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Noise and Loss in Balanced and Subharmonically Pumped Mixers: Part II--Application
Kerr, A.R.  

This paper appears in: Microwave Theory and Techniques, IEEE Transactions on
Publication Date: Dec 1979
Volume: 27,  Issue: 12
On page(s): 944- 950
ISSN: 0018-9480
Current Version Published: 2003-01-06

Abstract
The theory presented in Part I is applied here to some simple two-diode subharmonically pumped and balanced mixers. It is shown that the magnitude of the loop inductance (seen by currents circulating through the two diodes) affects the subharmonically pumped mixer much more strongly than the balanced mixer. The theory is also applied to the ideal two-diode mixer (balanced or subharmonically pumped) using exponential diodes with no series resistance and no nonlinear capacitance. It is shown that, like its single-diode counterpart, this mixer has a noise-equivalent lossy network whose physical temperature is eta T/2, where eta is the ideality factor of the exponential diodes. It follows that the ideal subharmonically pumped resistive mixer is not intrinsically less noisy than the ideal resistive fundamental mixer. This is not necessarily the case if parametric effects, due to nonlinear diode capacitance, are present.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (712 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved