Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Robust Boolean reasoning for equivalence checking and functional property verification
Kuehlmann, A.   Paruthi, V.   Krohm, F.   Ganai, M.K.  
Cadence Berkeley Labs, CA;

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: Dec 2002
Volume: 21,  Issue: 12
On page(s): 1377- 1394
ISSN: 0278-0070
INSPEC Accession Number: 7482576
Digital Object Identifier: 10.1109/TCAD.2002.804386
Current Version Published: 2002-12-16

Abstract
Many tasks in computer-aided design (CAD), such as equivalence checking, property checking, logic synthesis, and false paths analysis, require efficient Boolean reasoning for problems derived from circuits. Traditionally, canonical representations, e.g., binary decision diagrams (BDDs), or structural satisfiability (SAT) methods, are used to solve different problem instances. Each of these techniques offer specific strengths that make them efficient for particular problem structures. However, neither structural techniques based on SAT, nor functional methods using BDDs offer an overall robust reasoning mechanism that works reliably for a broad set of applications. The authors present a combination of techniques for Boolean reasoning based on BDDs, structural transformations, an SAT procedure, and random simulation natively working on a shared graph representation of the problem. The described intertwined integration of the four techniques results in a powerful summation of their orthogonal strengths. The presented reasoning technique was mainly developed for formal equivalence checking and property verification but can equally be used in other CAD applications. The authors' experiments demonstrate the effectiveness of the approach for a broad set of applications.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1274 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved