Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Sample Robbing in Predictive Speech Coders
Agrawal, J.   Iyer, S.  
University of Missouri-Kansas City, Kansas City, MO, USA;

This paper appears in: Communications, IEEE Transactions on
Publication Date: Nov 1986
Volume: 34,  Issue: 11
On page(s): 1068- 1072
ISSN: 0090-6778
Current Version Published: 2003-01-06

Abstract
In this paper, speech bit rate reduction by not transmitting a percentage of samples (i.e., robbing the coder of some samples) has been studied. The technique has been applied to predictive coders, namely differential PCM (DPCM) and adaptive DPCM (ADPCM) coders. A robbed sample is replaced by its estimate so that the prediction process in the feedback loop of the coders continues in a normal manner. After one period delay, when the next sample is decoded, the robbed sample is reestimated using delayed interpolation. Only periodic sample robbing has been considered, such as every fourth, every third, etc. The technique is particularly useful where graceful degradation is required under heavy loading conditions. The technique is found to be useful when the desired bit rate is 24 kbits/s or lower. The technique was evaluated by computer simulation using real-time speech inputs. Improvements of up to 3 dB in the case of a DPCM coder and of up to 1.5 dB in the case of an ADPCM coder have been achieved.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (512 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved