Information gain from count corrections in SPECT imagereconstruction and classification
Shao, L.
Hero, A.O.
Rogers, W.L.
Clinthorne, N.H.
Pennsylvania Univ. Hospital, Philadelphia, PA;
This paper appears in: Nuclear Science, IEEE Transactions on
Publication Date: Apr 1990
Volume: 37,
Issue: 2, Part 1
On page(s): 652-657
Location: San Francisco, CA, USA
ISSN: 0018-9499
References Cited: 7
CODEN: IETNAE
INSPEC Accession Number: 3724069
Digital Object Identifier: 10.1109/23.106693
Current Version Published: 2002-08-06
Abstract
The authors present a method for quantifying the impact of count
correction side information on the capability of a SPECT
(single-photon-emission computed tomography) projective tomography
system to perform image (emitter) reconstruction and feature
classification. The method involves computing the image or feature
related information gain which results from the presence of count
correction side information at the detector. For image reconstruction
this information gain is computed using Shannon's mutual information,
while for feature classification the cutoff rate of the SPECT
information channel is used. For reconstruction the gain is proportional
to the information divergence between the spatially dependent
probability of deletion of a γ-ray originating at a particular
emitter location and the spatially independent average deletion
probability. For classification the gain is proportional to the
difference between the arithmetic mean and the geometric mean of the
average number of γ-ray deletions for each of the image classes.
Results of analysis and numerical study are presented which indicate
that the information gain associated with using count correction data is
much more significant for reconstruction of the emitters than for
classification of the emitter density when the total detected fluence is
low
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