Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Multiple access channels with arbitrarily correlated sources
Cover, T.   Gamal, A.E.   Salehi, M.  

This paper appears in: Information Theory, IEEE Transactions on
Publication Date: Nov 1980
Volume: 26,  Issue: 6
On page(s): 648- 657
ISSN: 0018-9448
Current Version Published: 2003-01-06

Abstract
Let{(U_{i},V_{i})}_{i=1}^{n}be a source of independent identically distributed (i.i.d.) discrete random variables with joint probability mass functionp(u,v)and common partw=f(u)=g(v)in the sense of Witsenhausen, Gacs, and Körner. It is shown that such a source can be sent with arbitrarily small probability of error over a multiple access channel (MAC){cal X_{1} times cal X_{2},cal Y,p(y|x_{1},x_{2})},with allowed codes{x_{l}(u), x_{2}(v)}if there exist probability mass functionsp(s), p(x_{1}|s,u),p(x_{2}|s,v), such thatH(U|V)<I(X_{1}; Y|X_{2},V,S),H(V|U )<I(X_{2};Y|X_{1},U,S),H(U,V|W)<I(X_{1},X_{2};Y|W,S),H(U,V)<I(X_{1},X_{2};Y),mbox{where}p(s,u,v,x_{1},x_{2},y), Xl, X2, y)=p(s)p(u,v)p(x_{1}|u,s)p(x_{2}|v,s)p(y|x_{1},x_{2}).lifts region includes the multiple access channel region and the Slepian-Wolf data compression region as special cases.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1200 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved