Multiple importance sampling for first- and second-order polarization-mode dispersion
Fogal, S.L.
Biondini, G.
Kath, W.L.
Dept. of Eng. Sci. & Appl. Math., Northwestern Univ., Evanston, IL;
This paper appears in: Photonics Technology Letters, IEEE
Publication Date: Sep 2002
Volume: 14,
Issue: 9
On page(s): 1273- 1275
ISSN: 1041-1135
INSPEC Accession Number: 7392723
Digital Object Identifier: 10.1109/LPT.2002.801091
Current Version Published: 2002-11-07
Abstract
A simulation method that targets all possible combinations of first- and second-order polarization-mode dispersion (PMD) is described. Use of this method in importance-sampled Monte Carlo simulations yields a more comprehensive determination of PMD-induced system penalties than first-order biasing alone and significantly speeds up the calculation of outage probabilities, particularly when PMD compensation is employed. The technique is demonstrated by using it to calculate the probability distribution function (pdf) of second-order PMD and the joint pdf of the magnitude of first- and second-order PMD.
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