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Browse Standards > IEEE Std 1450.6.1-2009 ... Help

1450.6.1-2009  -  IEEE Standard for Describing On-Chip Scan Compression

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This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.

Date of Publication :
July 13 2009
Status :
Active
Page(s):
c1 - 56
E-ISBN :
978-0-7381-5962-1
Print ISBN:
978-0-7381-5963-8
References Cited:
4
Product Type:
Standards
Digital Object Identifier :
10.1109/IEEESTD.2009.5165453
Persistent Link: http://ieeexplore.ieee.org/servlet/opac?punumber=5165451
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Year :
2009
Date of Current Version :
17 July 2009
Issue Date :
July 13 2009

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