Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A 107.4 dB SNR Multi-Bit Sigma Delta ADC With 1-PPM THD at $-$0.12 dB From Full Scale Input
Wu, J.-Y.   Zhang, Z.   Subramoniam, R.   Maloberti, F.  

This paper appears in: Solid-State Circuits, IEEE Journal of
Publication Date: Nov. 2009
Volume: 44,  Issue: 11
On page(s): 3060-3066
ISSN: 0018-9200
Digital Object Identifier: 10.1109/JSSC.2009.2032753
Current Version Published: 2009-11-03

Abstract
A second order sigma delta modulator (SDM) with a 5-bit quantizer has been presented using several novel techniques: simplified DAC arrays for easy implementation, high-order truncation noise shaping for increased tolerance to analog imperfections, and an extended dynamic range for a maximum input signal swing of up to $-0.12 ~{hbox {dB}}_{rm FS}$ (Full Scale). With truncation filters and a pseudo SDM in the DSP, the truncation and saturation errors are compensated through the DAC arrays and the DSP. The design, fabricated in a 0.18 $mu{hbox {m}}$ dual gate oxide (DGO) process obtains a signal-to-noise-and–distortion ratio (SNDR) of 105.9 dB and a dynamic range (DR) of 107.4 dB with 31.25-KHz bandwidth at an 8-MHz sampling frequency and a power consumption of 14.7 mW.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1740 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved