Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

ROM-Based Logic (RBL) Design: A Low-Power 16 Bit Multiplier
Paul, B. C.   Fujita, S.   Okajima, M.  

This paper appears in: Solid-State Circuits, IEEE Journal of
Publication Date: Nov. 2009
Volume: 44,  Issue: 11
On page(s): 2935-2942
ISSN: 0018-9200
Digital Object Identifier: 10.1109/JSSC.2009.2028928
Current Version Published: 2009-11-03

Abstract
We present a ROM-based 16$,times,$ 16 multiplier for low-power applications. The design uses sixteen 4$,times,$4 ROM-based multiplier blocks followed by carry-save adders and a final carry-select adder (all ROM-based) to obtain the 32 bit output. All ROM blocks are implemented using single transistor ROM cells and eliminating identical rows and columns for optimizing the power and performance. Measurement results in 0.18 $mu$m CMOS process show a 40% reduction in power over the conventional carry-save array multiplier when operated at its maximum frequency. The ROM-based design also provides 44% less delay than the array multiplier with a minimal increase (7.7%) in power. This demonstrates the low-power operation of the ROM-based multiplier also at higher frequencies.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1357 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved