Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Blind adaptive constrained moe receiver for uplink MC-CDMA systems with real signaling in multi-cell environments
Bangwon Seo   Hyung-Myung Kim  
Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea;

This paper appears in: Wireless Communications, IEEE Transactions on
Publication Date: October 2009
Volume: 8,  Issue: 10
On page(s): 4911-4915
ISSN: 1536-1276
INSPEC Accession Number: 10929053
Digital Object Identifier: 10.1109/TWC.2009.080904
Current Version Published: 2009-10-20

Abstract
A blind adaptive constrained minimum output energy (MOE) receiver has been proposed for the uplink multicarrier code-division multiple access (MC-CDMA) system in a multicell environment when some users, including the desired user, employ real-valued modulation such as binary phase-shift keying (BPSK) or amplitude-shift keying (ASK). Since the imaginary part of residual interference at the filter output does not affect the decision of the desired user's data in this case, the proposed receiver has been designed to perfectly eliminate the real part of residual in-cell interference using the information of the spreading sequence and to reduce the real part of residual intercell interference by minimizing the constrained output energy. Results of analysis and simulation show that the proposed blind adaptive algorithm converges faster and has a higher steadystate signal-to-interference and noise ratio (SINR) than those of conventional schemes.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (331 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved