Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Analysis and Optimization of Current-Driven Passive Mixers in Narrowband Direct-Conversion Receivers
Mirzaei, A.   Darabi, H.   Leete, J.C.   Xinyu Chen   Juan, K.   Yazdi, A.  
Broadcom Corp., Irvine, CA, USA;

This paper appears in: Solid-State Circuits, IEEE Journal of
Publication Date: Oct. 2009
Volume: 44,  Issue: 10
On page(s): 2678-2688
ISSN: 0018-9200
INSPEC Accession Number: 10880536
Digital Object Identifier: 10.1109/JSSC.2009.2027937
Current Version Published: 2009-09-22

Abstract
Properties of the current-driven passive mixer are explored to maximize its performance in a zero-IF receiver. Since there is no reverse isolation between the RF and baseband sides of the mixer, the mixer reflects the baseband impedance to the RF and vice versa through simple frequency shifting. It is also shown that in an IQ down-conversion system the lack of reverse isolation causes a mutual interaction between the two quadrature mixers, which results in different high- and low-side conversion gains, and unexpected IIP2 and IIP3 values. With a thorough and accurate mathematical analysis it is shown how to design this mixer and its current buffer, and how to size components to get the best linearity, conversion gain and noise figure while alleviating the IQ cross-talk problem.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1470 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved