Guest Editorial
Dai, F. F.
Stroud, C. E.
Zhang, J. B.
This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: July 2009
Volume: 56,
Issue: 7
On page(s): 2295-2298
ISSN: 0278-0046
Digital Object Identifier: 10.1109/TIE.2009.2022381
Current Version Published: 2009-06-30
Abstract
This special section includes nine papers in the areas of radiofrequency identification (RFID) design, application, and test, providing a comprehensive look at the unique issues, challenges, and capabilities of this relatively recent technological advance.
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