Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Speeding up model checking by exploiting explicit and hidden verification constraints
Cabodi, G.   Camurati, P.   Garcia, L.   Murciano, M.   Nocco, S.   Quer, S.  
Dipt. di Autom. ed Inf., Politec. di Torino, Torino;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1686-1691
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730449
Current Version Published: 2009-06-23

Abstract
Constraints represent a key component of state-of-the-art verification tools based on compositional approaches and assume-guarantee reasoning. In recent years, most of the research efforts on verification constraints have focused on defining formats and techniques to encode, or to synthesize, constraints starting from the specification of the design. In this paper, we analyze the impact of constraints on the performance of model checking tools, and we discuss how to effectively exploit them. We also introduce an approach to explicitly derive verification constraints hidden in the design and/or in the property under verification. Such constraints may simply come from true design constraints, embedded within the properties, or may be generated in the general effort to reduce or partition the state space. Experimental results show that, in both cases, we can reap benefits for the overall verification process in several hard-to-solve designs, where we obtain speed-ups of more than one order of magnitude.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (135 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved