Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Speculative reduction-based scalable redundancy identification
Mony, H.   Baumgartner, J.   Mishchenko, A.   Brayton, R.  
IBM Syst.&Technol. Group, Austin, TX, USA;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1674-1679
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10757827
Current Version Published: 2009-06-23

Abstract
The process of sequential redundancy identification is the cornerstone of sequential synthesis and equivalence checking frameworks. The scalability of the proof obligations inherent in redundancy identification hinges not only upon the ability to cross-assume those redundancies, but also upon the way in which these assumptions are leveraged. In this paper, we study the technique of speculative reduction for efficiently modeling redundancy assumptions. We provide theoretical and experimental evidence to demonstrate that speculative reduction is fundamental to the scalability of the redundancy identification process under various proof techniques. We also propose several techniques to speed up induction-based redundancy identification. Experiments demonstrate the effectiveness of our techniques in enabling substantially faster redundancy identification, up to six orders of magnitude on large designs.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (119 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved