Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Algorithm-architecture co-design of soft-output ML MIMO detector for parallel application specific instruction set processors
Min Li   Fasthuber, R.   Novo, D.   Bougard, B.   Van Der Perre, L.   Catthoor, F.  
IMEC, Leuven;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1608-1613
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730437
Current Version Published: 2009-06-23

Abstract
Emerging SDR baseband platforms are usually based on multiple DLP+ILP processors with massive parallelism. Although these platforms would theoretically enable advanced SDR signal processing, existing work implemented basic systems and simple algorithms. Importantly, MIMO is not fully supported in most implementations. Implemented MIMO but with a simple linear detector. Our work explores the feasibility for SDR implementations of soft-output ML MIMO detectors, which brings 6-12 dB SNR gains when compared to popular linear detectors. Although soft-output ML MIMO detectors are considered to be challenging even for ASICs, we combine architecture-friendly algorithms, application specific instructions, code transformations and ILP/DLP explorations to make SDR implementations feasible. In our work, a 2times4 ADRES based ASIP with 16-way SIMD can deliver 193 Mbps for 2times2 64 QAM, and 368 Mbps for 2times2 16 QAM transmissions. To the best of our knowledge, this is the first work exploring SDR based soft-output ML MIMO detectors.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (302 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved