Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Exploiting structure in an AIG based QBF solver
Pigorsch, Florian   Scholl, Christoph  
Albert-Ludwigs-Universität Freiburg, Institut für Informatik, D-79110 Freiburg im Breisgau, Germany;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1596-1601
Location: Nice, France,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
Current Version Published: 2009-06-23

Abstract
In this paper we present a procedure for solving quantified boolean formulas (QBF), which uses And-Inverter Graphs (AIGs) as the core data-structure. We make extensive use of structural information extracted from the input formula such as functional definitions of variables and non-linear quantifier structures. We show how this information can directly be exploited by the symbolic, AIG based representation. We implemented a prototype QBF solver based on our ideas and performed a number of experiments proving the effectiveness of our approach, and moreover, showing that our method is able to solve QBF instances on which state-of-the-art QBF solvers known from literature fail.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (66 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved