Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Exploiting clock skew scheduling for FPGA
Sungmin Bae   Mangalagiri, P.   Vijaykrishnan, N.  
CSE Dept., Pennsylvania State Univ., University Park, PA;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1524-1529
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730407
Current Version Published: 2009-06-23

Abstract
Clock skew scheduling (CSS) is an effective technique to optimize clock period of sequential designs. However, these techniques are not effective in the presence of certain design structural constraints that limit the CSS. In this paper, we present an analysis of several design structural constraints that affect the CSS and propose techniques to resolve these constraints. Furthermore, we propose a CSS FPGA architecture and a novel clock-period optimization (CPO) flow that tackles some of these constraints by exploiting the re-configurability of FPGAs. Experimental results demonstrate that the proposed FPGA architecture with the CPO flow achieved an average performance improvement of 24.4% which was an average performance improvement of 10.7% over the CPO flow without considering the constraints.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (351 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved