Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

A formal approach for specification-driven AMS behavioral model generation
Mukherjee, S.   Ain, A.   Panda, S.K.   Mukhopadhyay, R.   Dasgupta, P.  
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Kharagpur, Kharagpur;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1512-1517
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730405
Current Version Published: 2009-06-23

Abstract
Behavioral models for analog and mixed signal (AMS) designs are developed at various levels of abstraction, using various types of languages, to cater to a wide variety of requirements, ranging from verification, design space exploration, test generation, and application demonstration. In this paper we present a high-level formalism for capturing the AMS design intent from the specification and present techniques for automatic generation of AMS behavioral models. The proposed formalism is a language independent one, yet the design intent is modeled at a level of abstraction which enables easy translation into common modeling standards. We demonstrate the translation into VerilogA and SPICE, which are fundamentally different standards for behavioral modeling. The proposed approach is demonstrated using a family of Low Dropout Regulators (LDO) as the reference.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (220 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved