Seed selection in LFSR-reseeding-based test compression for the detection of small-delay defects
Yilmaz, M.
Chakrabarty, K.
Design for Test Group, Adv. Micro Devices, Sunnyvale, CA;
Abstract
Test data volume and test application time are major concerns for large industrial circuits. In recent years, many compression techniques have been proposed and evaluated using industrial designs. However, these methods do not target sequence- or timing-dependent failures while compressing the test patterns. Timing-related failures in high-performance integrated circuits are now increasingly dominated by small-delay defects (SDDs). We present a SDD-aware seed-selection technique for LFSR-reseeding-based test compression. Experimental results show that significant test-pattern-quality increase can be achieved when seeds are selected to target SDDs.
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