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Exploiting narrow-width values for thermal-aware register file designs
Shuai Wang   Jie Hu   Ziavras, S.G.   Sung Woo Chung  
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1422-1427
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730375
Current Version Published: 2009-06-23

Abstract
Localized heating-up creates thermal hotspots across the chip, with the integer register file ranked as the hottest unit in high-performance microprocessors. In this paper, we perform a detailed study on the thermal behavior of a low-power value-aware register file (VARF) that is subjected to internal fine-grain hotspots. To further optimize its thermal behavior, we propose and evaluate three thermal-aware control schemes, thermal sensor (TS), access counter (AC), and register-id (ID) based, to balance the access activity and thus the temperature across different partitions in the VARF. The simulation results using SPEC CINT2000 benchmarks show that the register-id controlled VARF (ID-VARF) scheme achieves optimized thermal behavior at minimum cost as compared to the other schemes. We further evaluate the performance impact of the thermal-aware VARF design with the dynamic thermal management (DTM). The experimental results show that the ID-VARF can improve the performance by 26.1% and 7.2% over the conventional register file and the original VARF design, respectively.

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