Abstract
Programmable logic arrays (PLAs) using self-assembly nanowire crossbars have shown promising potential for future nano-scale circuit design. However, due to the density and size factors of nanowires and molecular switches, the fabrication fault densities are much higher than those of the conventional silicon technology, and hence pose greater design challenges. In this paper, we propose a novel defect-aware logic mapping framework via Boolean satisfiability (SAT). Compared with the prior works, our technique considers PLA defects on both input and output planes at the same time. This synergistic approach can help solve logic mapping problems with higher defect rates. The proposed method is universally suitable for various nanoscale PLAs, including AND/OR, NOR/NOR structures, etc. The experimental results have shown that it can efficiently solve large mapping problems at a total defect rate of 20% or even higher. We further investigate the impact of different defects on PLA mapping, which helps set up an initial contribution for yield estimation and utilization of partially-defective PLAs.
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