Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Online adaptation policy design for grid sensor networks with reconfigurable embedded nodes
Subramanian, V.   Gilberti, M.   Doboli, A.  
Dept. of Electr. & Comput. Eng., State Univ. of New York at Stony Brook, Stony Brook, NY;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1273-1278
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730348
Current Version Published: 2009-06-23

Abstract
This paper presents a systematic methodology for designing the adaptation policies of reconfigurable sensor networks. The work is motivated by the need to provide efficient sensing, processing, and networking capabilities under tight hardware, bandwidth, and energy constraints. The design flow includes two main steps: generation of alternative design points representing different performance-cost trade-offs, and finding the switching rates between the points to achieve effective adaptation. Experiments studied the scaling of the methods with the size of the networks, and the effectiveness of the produced policies with respect to data loss, latency, power consumption, and buffer space.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (167 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved