Test exploration and validation using transaction level models
Kochte, M.A.
Zoellin, C.G.
Imhof, M.E.
Khaligh, R.S.
Radetzki, M.
Wunderlich, H.-J.
Di Carlo, S.
Prinetto, P.
Inst. of Comput. Archit. & Comput. Eng., Univ. of Stuttgart, Stuttgart;
Abstract
The complexity of the test infrastructure and test strategies in systems-on-chip approaches the complexity of the functional design space. This paper presents test design space exploration and validation of test strategies and schedules using transaction level models (TLMs). Since many aspects of testing involve the transfer of a significant amount of test stimuli and responses, the communication-centric view of TLMs suits this purpose exceptionally well.
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