Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

On the efficient reduction of complete EM based parametric models
Villena, J.F.   Ciuprina, G.   Ioan, D.   Silveira, L.M.  
INESC ID/IST, Tech. Univ. Lisbon, Lisbon;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1172-1177
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730321
Current Version Published: 2009-06-23

Abstract
Due to higher integration and increasing frequency based effects, full electromagnetic models (EM) are needed for accurate prediction of the real behavior of integrated passives and interconnects. Furthermore, these structures are subject to parametric effects due to small variations of the geometric and physical properties of the inherent materials and manufacturing process. Accuracy requirements lead to huge models, which are expensive to simulate and this cost is increased when parameters and their effects are taken into account. This paper presents a complete procedure for efficient reduction of realistic, hierarchy aware, EM based parametric models. Knowledge of the structure of the problem is explicitly exploited using domain partitioning and novel electromagnetic connector modeling techniques to generate a hierarchical representation. This enables the efficient use of block parametric model order reduction techniques to generate block-wise compressed models that satisfy overall requirements, and provide accurate approximations of the complete EM behaviour, which are cheap to evaluate and simulate.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (396 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved