Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Mode-based reconfiguration of critical software component architectures
Borde, E.   Haik, G.   Pautet, L.  
THALES Land & Joint Syst., Massy;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 1160-1165
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730318
Current Version Published: 2009-06-23

Abstract
Designing reconfigurable yet critical embedded and complex systems (i.e. systems composed of different subsystems) requires making these systems adaptable while guaranteeing that they operate with respect to predefined safety properties. When it comes to complex systems, component-based software engineering methods provide solutions to master this complexity (ldquodivide to conquerrdquo). In addition, architecture description languages provide solutions to design and analyze critical and reconfigurable embedded systems. In this paper we propose a methodology that combines the benefits of these two approaches by leaning on both AADL and Lightweigth CCM standards. This methodology is materialized through a complete design process and an associated framework, MyCCM-HI, dedicated to designing reconfigurable, critical, and complex embedded systems.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (298 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved