Selection of a fault model for fault diagnosis based on unique responses
Pomeranz, I.
Reddy, S.M.
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA;
Abstract
We describe a preprocessing step to fault diagnosis of an observed response obtained from a faulty chip. In this step, a fault model for diagnosing the observed response is selected. This step allows fault diagnosis to be performed based on a single fault model after identifying the most appropriate one. We describe a specific implementation of this preprocessing step based on what is referred to as the unique output response of a fault model. As an example, we apply it to the diagnosis of multiple stuck-at faults, selecting between single and double stuck-at faults as the fault model for diagnosis. Experimental results demonstrate improvements compared to diagnosis based on single stuck-at faults, and compared to diagnosis based on both single and double stuck-at faults.
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