Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Adaptive idleness distribution for non-uniform aging tolerance in MultiProcessor Systems-on-Chip
Paterna, F.   Benini, L.   Acquaviva, A.   Papariello, F.   Desoli, G.   Olivieri, M.  
DEIS, Univ. of Bologna, Bologna;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 906-909
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730286
Current Version Published: 2009-06-23

Abstract
In deep submicron designs of MultiProcessor Systems-on-Chip (MPSoC) architectures, uncompensated within-die process variations and aging effects will lead to an increasing uncertainty and unbalancing of expected core lifetimes. In this paper we present an adaptive workload allocation strategy for run-time compensation of variations- and aging-induced unbalanced core lifetimes by means of core activity duty cycling. The proposed techniques regulates the percentage of idle time on short-expected-life cores to meet the platform lifetime target with minimum performance degradation. Experiments have been conducted on a multiprocessor simulator of a next-generation industrial MPSoC platform for multimedia applications made of a general purpose processor and programmable accelerators.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (3417 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved