Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Analysis and optimization of fault-tolerant embedded systems with hardened processors
Izosimov, V.   Polian, I.   Pop, P.   Eles, P.   Zebo Peng  
Dept. of Comput. & Inf. Sci., Linkoping Univ., Linkoping;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 682-687
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730504
Current Version Published: 2009-06-23

Abstract
In this paper we propose an approach to the design optimization of fault-tolerant hard real-time embedded systems, which combines hardware and software fault tolerance techniques. We trade-off between selective hardening in hardware and process re-execution in software to provide the required levels of fault tolerance against transient faults with the lowest-possible system costs. We propose a system failure probability (SFP) analysis that connects the hardening level with the maximum number of re-executions in software. We present design optimization heuristics, to select the fault-tolerant architecture and decide process mapping such that the system cost is minimized, deadlines are satisfied, and the reliability requirements are fulfilled.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (158 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved