Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Combined system synthesis and communication architecture exploration for MPSoCs
Lukasiewycz, M.   Streubuhr, M.   Glass, M.   Haubelt, C.   Teich, J.  
Univ. of Erlangen-Nuremberg, Erlangen;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 472-477
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730463
Current Version Published: 2009-06-23

Abstract
In this paper, a novel design space exploration approach is proposed that enables a concurrent optimization of the topology, the process binding, and the communication routing of a system. Given an application model written in SystemC TLM 2.0, the proposed approach performs a fully automatic optimization by a simultaneous resource allocation, task binding, data mapping, and transaction routing for MPSoC platforms. To cope with the huge complexity of the design space, a transformation of the transaction level model to a graph-based model and symbolic representation that allows multi-objective optimization is presented. Results from optimizing a motion-JPEG decoder illustrate the effectiveness of the proposed approach.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (173 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved