Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Reconfigurable circuit design with nanomaterials
Chen Dong   Chilstedt, S.   Deming Chen  
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 442-447
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730458
Current Version Published: 2009-06-23

Abstract
It is generally acknowledged that nanoelectronics will eventually replace traditional silicon CMOS in high-performance integrated circuits. To that end, considerable investments are being made in the research and development of new nanoelectronic devices and fabrication techniques. When these technologies mature, they can be used to create the next generation of electronic systems. Given the intrinsic properties of nanomaterials, such systems are likely to deviate considerably from their predecessors. In this paper, we compare two potential architectures for the design of nanoelectronic FPGAs. By evaluating the performance of nanoelectronic devices at the systems level, we aim to provide insights into how they can be used effectively.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (323 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved