Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Power reduction of a 12-bit 40-MS/s pipeline ADC exploiting partial amplifier sharing
Diaz-Madrid, J.A.   Neubauer, H.   Hauer, H.   Domenech-Asensi, G.   Ruiz-Merino, R.  
Integrated Circuit Design - Analog, Fraunhofer Inst. for Integrated Circuits, Erlangen;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 369-373
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730430
Current Version Published: 2009-06-23

Abstract
High performance analog-to-digital converters (ADC) are essential elements for the development of high performance image sensors. These circuits need a big number of ADCs to reach the required resolution at a specified speed. Moreover, nowadays power dissipation has become a key performance to be considered in analog designs, specially in those developed for portable devices. Design of such circuits is a challenging task which requires a combination of the most advanced digital circuit, the analog expertise knowledge and an iterative design. Amplifier sharing has been a commonly used technique to reduce power dissipation in pipelined ADCs. In this paper we present a partial amplifier sharing topology of a 12 bit pipeline ADC, developed in 0.35 mum CMOS process. Its performance is compared with a conventional amplifier scaling topology and with a fully amplifier sharing one.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (921 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved