Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Simulation framework for early phase exploration of SDR platforms: A case study of platform dimensioning
Trautmann, M.   Mamagkakis, S.   Bougard, B.   Declerck, J.   Umans, E.   Dejonghe, A.   Van der Perre, L.   Catthoor, F.  
Katholieke Univ. Leuven, Leuven;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 312-315
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730421
Current Version Published: 2009-06-23

Abstract
Software Defined Radio (SDR) terminals are crucial to enable seamless and transparent inter-working between fourth generation wireless access systems or communication modes. On the longer term, SDRs will be extended to become cognitive radios enabling efficient spectrum usage. Future communication modes will have heavy hardware resource requirements and switching between them will introduce dynamism in respect with timing and size of resource requests. In this paper, we propose a modeling framework that enables the simulation of such complex, dynamic hardware/software SDR designs. Thus, we can do an exploration, which can pinpoint the coarse grain platform component requirements for future SDR applications in a very early design phase. Our solution differs from existing ones by combining multiple simulation granularities in a way that is specialized for SDR simulation. Finally, we demonstrate the effectiveness of our approach with a case study for dimensioning the on-chip interconnect of a prospective SDR platform.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (133 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved