Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Analogue mixed signal simulation using spice and SystemC
Kirchner, T.   Bannow, N.   Grimm, C.  
Corp. Sector Res. & Adv. Eng., Robert Bosch GmbH, Stuttgart;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 284-287
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730395
Current Version Published: 2009-06-23

Abstract
SystemC is a discrete event simulator that enables the programmer to model complex designs with varying levels of abstraction. In order to improve precision, it can be coupled to more specialized simulators. This article introduces the concept of loose simulator coupling between an analogue simulator and SystemC. It explains the properties and advantages which include a higher simulation performance as well as a higher degree of flexibility. A design example in which SystemC will be connected to SwitcherCad will demonstrate the benefits of loose coupling.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (262 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved