Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Evaluating UML2 modeling of IP-XACT objects for automatic MP-SoC integration onto FPGA
Arpinen, T.   Koskinen, T.   Salminen, E.   Hamalainen, T.D.   Hannikainen, M.  
Dept. of Comput. Syst., Tampere Univ. of Technol., Tampere;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 244-249
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730388
Current Version Published: 2009-06-23

Abstract
IP-XACT is a standard for describing intellectual property metadata for System-on-Chip (SoC) integration. Recently researchers have proposed visualizing and abstracting IP-XACT objects using structural UML2 model elements and diagrams. Despite the number of proposals at conceptual level, experiences on utilizing this representation in practical SoC development environments are very limited. This paper presents how UML2 models of IP-XACT features can be utilized to efficiently design and implement a multiprocessor SoC prototype on FPGA. The main contribution of this paper is the experimental development of a multiprocessor platform on FPGA using UML2 design capture, IP-XACT compatible components, and design automation tools. In addition, modeling concepts are improved from earlier work for the utilized integration methodology.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (196 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved