Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Model-based synthesis and optimization of static multi-rate image processing algorithms
Keinert, J.   Dutta, H.   Hannig, F.   Haubelt, C.   Teich, J.  
Digital Cinema Dept., Fraunhofer IIS, Erlangen, Germany;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 135-140
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10757812
Current Version Published: 2009-06-23

Abstract
High computational effort in modern image processing applications like medical imaging or high-resolution video processing often demands for massively parallel special purpose architectures in form of FPGAs or ASICs. However, their efficient implementation is still a challenge, as the design complexity causes exploding development times and costs. This paper presents a new design flow which permits to specify, analyze, and synthesize complex image processing algorithms. A novel buffer requirement analysis allows exploiting possible tradeoffs between required communication memory and computational logic for multi-rate applications. The derived schedule and buffer results are taken into account for resource optimized synthesis of the required hardware accelerators. Application to a multi-resolution filter shows that buffer analysis is possible in less than one second and that scheduling alternatives influence the required communication memory by up to 24% and the computational resources by up to 16%.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (185 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved