Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Multi-clock Soc design using protocol conversion
Sinha, R.   Roop, P.S.   Basu, S.   Salcic, Z.  
Univ. of Auckland, Auckland;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 123-128
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10730362
Current Version Published: 2009-06-23

Abstract
The automated design of SoCs from pre-selected IPs that may require different clocks is challenging because of the following issues. Firstly, protocol mismatches between IPs need to be resolved automatically before IPs are integrated. Secondly, the presence of multiple clocks makes the protocol conversion even more difficult. Thirdly, it is desirable that the resulting integration is correct-by-construction, i.e., the resulting SoC satisfies given system-level specifications. All of these issues have been studied extensively, although not in a unifying manner. In this paper we propose a framework based on protocol conversion that addresses all these issues. We have extensively studied many SoC design problems and show that the proposed methodology is capable of handling them better than other known approaches. A significant contribution of the proposed approach is that it nicely generalizes many existing techniques for formal SoC design and integrates them into a single approach.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (4072 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved