Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Pipelined data parallel task mapping/scheduling technique for MPSoC
Hoeseok Yang   Soonhoi Ha  
Sch. of EECS, Seoul Nat. Univ., Seoul, South Korea;

This paper appears in: Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Publication Date: 20-24 April 2009
On page(s): 69-74
Location: Nice,
ISSN: 1530-1591
ISBN: 978-1-4244-3781-8
INSPEC Accession Number: 10757802
Current Version Published: 2009-06-23

Abstract
In this paper, we propose a multi-task mapping/scheduling technique for heterogeneous and scalable MPSoC. To utilize the large number of cores embedded in MPSoC, the proposed technique considers temporal and data parallelisms as well as task parallelism. We define a multi-task mapping/scheduling problem with all these parallelisms and propose a QEA (quantum-inspired evolutionary algorithm)-based heuristic. Compared with an ILP (Integer Linear Programming) approach, experiments with real-life examples show the feasibility and the efficiency of the proposed technique.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (336 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved