Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article
Email/Printer Friendly Format  
 

Study of the Effect and Design Criteria of the Input Filter for Buck Converters With Peak Current-Mode Control Using a Novel System Block Diagram
Shen-Yaur Chen   Jin-Jia Chen  
Dept. of Electr. Eng., Nat. Changhua Univ. of Educ., Changhua;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Aug. 2008
Volume: 55,  Issue: 8
On page(s): 3159-3166
ISSN: 0278-0046
INSPEC Accession Number: 10118362
Digital Object Identifier: 10.1109/TIE.2008.920547
First Published: 2008-03-14
Current Version Published: 2008-07-29

Abstract
The effect and design criteria of the input filter for buck converters with peak current-mode (PCM) control are researched using a novel system block diagram. With this diagram, a novel current loop transfer function is proposed to derive the design criteria that apply to designing the input filter. However, the input filter that is added to reduce electromagnetic interference will significantly change the dynamic property of the PCM-controlled buck converter. Therefore, the induced effect due to the input filter is examined. Finally, experimental results prove the accuracy of this deduction in both the circuit simulation and the circuit experiment.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (829 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved