Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

On measuring memory length of the error rate process in wireless channels
Ilyas, M.U.   Radha, H.  
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI;

This paper appears in: Information Sciences and Systems, 2008. CISS 2008. 42nd Annual Conference on
Publication Date: 19-21 March 2008
On page(s): 1262-1267
Location: Princeton, NJ,
ISBN: 978-1-4244-2246-3
INSPEC Accession Number: 10073803
Digital Object Identifier: 10.1109/CISS.2008.4558712
Current Version Published: 2008-07-09

Abstract
Bit errors are orders of magnitude more frequent in wireless channels than in wired channels. Design of network protocols and other architectural components of wireless networking systems entail a better understanding of the process that introduces errors into transmissions. A key characteristic of the error process operating on a channel is its memory length which determines the degree of similarity and clustering of errors. In this paper we demonstrate the inadequacy of correlation coefficient based analysis used in determining memory length of bit level errors to the packet-level bit error rate (BER) process. To overcome this problem we propose an alternate means of measuring channel memory, called the relative mutual information (RMI) and a lower complexity variant, the pairwise RMI. We demonstrate the use of RMI and pairwise RMI to sets of residual bit-error traces collected in IEEE 802.15.4 low rate-wireless personal area network (LR-WPAN) and IEEE 802.11b wireless local area network (WLAN) channels.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (529 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved