Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

A deterministic multi-way rendezvous library for haskell
Vasudevan, N.   Singh, S.   Edwards, S.A.  
Dept. of Comput. Sci., Columbia Univ. New York, Columbia, NY;

This paper appears in: Parallel and Distributed Processing, 2008. IPDPS 2008. IEEE International Symposium on
Publication Date: 14-18 April 2008
On page(s): 1-12
Location: Miami, FL,
ISSN: 1530-2075
ISBN: 978-1-4244-1693-6
INSPEC Accession Number: 10025196
Digital Object Identifier: 10.1109/IPDPS.2008.4536312
Current Version Published: 2008-06-03

Abstract
The advent of multicore processors requires mainstream concurrent programming languages with high level concurrency constructs and effective debugging techniques. Unfortunately, many concurrent programming languages are non-deterministic and allow data races. We present a deterministic concurrent communication library for an existing multi-threaded language. We implemented the SHIM communication model in the Haskell functional language, which supports asynchronous communication and transactional memory. The SHIM model uses multi-way rendezvous to guarantee determinism. We describe two implementations of the model in Haskell, demonstrating the ease of writing such a library. We illustrate our library with examples and experimentally compare two implementations. We also compare our new model with equivalent sequential programs and parallel versions using Haskell's existing concurrency mechanisms.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (137 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved