Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Steady-State and Dynamic Study of Active Power Filter With Efficient FPGA-Based Control Algorithm
Zeliang Shu   Yuhua Guo   Jisan Lian  
Southwest Jiaotong Univ., Chengdu;

This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: April 2008
Volume: 55,  Issue: 4
On page(s): 1527-1536
ISSN: 0278-0046
INSPEC Accession Number: 9920939
Digital Object Identifier: 10.1109/TIE.2008.917151
Current Version Published: 2008-04-04

Abstract
A new approach using field-programmable gate array (FPGA) to implement a fully digital control algorithm of active power filter (APF) is proposed in this paper. This FPGA-based controller integrates the whole signal-processing function of an APF, including synchronous-reference-frame transform, low-pass filter, three-phase phase-locked loop, inverter-current controller, etc. By case studies on the principle, performance, and architecture, these control blocks are implemented in real-time and synthesized into a medium-scale FPGA chip by adopting some useful digital-signal-processing techniques, such as pipelining, folding and strength reduction, with respect to minimization of hardware resource and enhancement of operating frequency. As a result, the whole algorithm needs around 5000 logic elements and can run at synchronous system-clock rates of up to 65 MHz. Experimental results on a laboratory prototype are given to demonstrate performance of the proposed approach during steady-state and dynamic operations.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (617 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved