Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Reconfigurable Functional Units for Scientific Superscalar Processors
Evans, J.   Rupnow, K.   Compton, K.  
Univ. of Wisconsin-Madison, Madison;

This paper appears in: Field-Programmable Technology, 2007. ICFPT 2007. International Conference on
Publication Date: 12-14 Dec. 2007
On page(s): 73-80
Location: Kitakyushu,
ISBN: 978-1-4244-1472-7
INSPEC Accession Number: 9808640
Digital Object Identifier: 10.1109/FPT.2007.4439234
Current Version Published: 2008-01-22

Abstract
As it becomes more difficult to increase single-threaded performance, focus on multi-core processor designs increases. However, individual core performance is still important, especially for long-executing applications such as in scientific computing. Based on scientific application needs as modeled by SPEC-FP and a set of applications from Sandia National Labs, we have created several different reconfigurable functional unit (RFU) designs for superscalar multi-processor supercomputers. This paper discusses the design process and evaluates the RFUs' ability to implement instruction dataflow graphs from scientific workloads. Our best-performing RFU design is able to implement 89% of the dataflow graphs in the benchmarks.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (3263 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved