Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Nonregenerative MIMO Relaying With Optimal Transmit Antenna Selection
Peters, S.   Heath, R.W.  
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX;

This paper appears in: Signal Processing Letters, IEEE
Publication Date: 2008
Volume: 15,  On page(s): 421-424
ISSN: 1070-9908
INSPEC Accession Number: 10003215
Digital Object Identifier: 10.1109/LSP.2008.921466
Current Version Published: 2008-04-22

Abstract
We derive optimal SNR-based transmit antenna selection rules at the source and relay for the nonregenerative half-duplex MIMO relay channel. While antenna selection is a suboptimal form of beamforming, it has the advantage that the optimization is tractable and can be implemented with only a few bits of feedback from the destination to the source and relay. We compare the bit error rate of optimal antenna selection at both the source and relay to other proposed beamforming techniques and propose methods for performing the necessary limited feedback.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (181 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved