Curve Tracking for Rapid Imaging in AFM
Andersson, S.B.
Boston Univ., Boston;
This paper appears in: NanoBioscience, IEEE Transactions on
Publication Date: Dec. 2007
Volume: 6,
Issue: 4
On page(s): 354-361
ISSN: 1536-1241
INSPEC Accession Number: 9743381
Digital Object Identifier: 10.1109/TNB.2007.909014
Current Version Published: 2007-12-04
Abstract
A high-level feedback control approach for rapid imaging in atomic force microscopy is presented. The algorithms are designed for samples which are string-like, such as biopolymers, and for boundaries. Rather than the simple raster-scan pattern, data from the microscope are used in real-time to steer the tip along the sample, drastically reducing the area to be imaged. An order-of-magnitude reduction in the time to acquire an image is possible. The technique is illustrated through simulations and through physical experiments.
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