Effects of Interactions Between Filter Parasitics and Power Interconnects on EMI Filter Performance
Shuo Wang
van Wyk, J.D.
Lee, F.C.
Virginia Tech, Blacksburg;
This paper appears in: Industrial Electronics, IEEE Transactions on
Publication Date: Dec. 2007
Volume: 54,
Issue: 6
On page(s): 3344-3352
ISSN: 0278-0046
INSPEC Accession Number: 9692668
Digital Object Identifier: 10.1109/TIE.2007.906126
Current Version Published: 2007-11-19
Abstract
This paper first analyzes the electrical parameters of differential-mode (DM) and common-mode (CM) propagation on power interconnects. The impedance-transformation effects of the power interconnects are then investigated. The interactions between the parasitic parameters in electromagnetic-interference (EMI) filters and the transformed impedances by the power interconnects are explored in detail. It is found that the interactions can degrade EMI-filter performance at high frequencies. Simulations and experiments are finally carried out to verify the analysis.
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